Picosecond Transient Thermoreflectance for Thermal Conductivity Characterization

Citation:

J. Jeong, Meng, X., Rockwell, A. K., Bank, S. R., Hsieh, W. - P., Lin, J. - F., and Wang, Y., “Picosecond Transient Thermoreflectance for Thermal Conductivity Characterization,” Nanoscale and Microscale Thermophysical Engineering, In Press, 2019.

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Publisher's Version