Scanning Thermal Microscopy of Carbon Nanotubes using Batch-Fabricated Probes


L. Shi, Plyasunov, S., Bachtold, A., McEuen, P. L., and Majumdar, A., “Scanning Thermal Microscopy of Carbon Nanotubes using Batch-Fabricated Probes,” Appl. Phys. Lett., vol. 77, pp. 4295–4298, 2000.


We have designed and batch-fabricated thin-film thermocouple cantilever probes for scanning thermal microscopy (SThM). Here, we report the use of these probes for imaging the phonon temperature distribution of electrically heated carbon-nanotube (CN) circuits. The SThM images reveal possible heat dissipation mechanisms in CN circuits. The experiments also demonstrate that heat flow through the tip-sample nanoscale junction under ambient conditions is dominated by conduction through a liquid film bridging the two surfaces. With the spatial resolution limited by tip radius to about 50 nm, SThM now offers the promising prospects of studying electron-phonon interactions and phonon transport in low dimensional nanostructures.